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Laung-Terng Wang
Laung-Terng Wang, Ph.D., is founder, chairman, and chief executive officer of SynTest Technologies, CA. He received his EE Ph.D. degree from Stanford University. A Fellow of the IE...показать большеLaung-Terng Wang, Ph.D., is founder, chairman, and chief executive officer of SynTest Technologies, CA. He received his EE Ph.D. degree from Stanford University. A Fellow of the IEEE, he holds 18 U.S. Patents and 12 European Patents, and has co-authored/co-edited two internationally used DFT textbooks- VLSI Test Principles and Architectures (2006) and System-on-Chip Test Architectures (2007).показать меньше
Книги автора Laung-Terng Wang
VLSI Test Principles and Architectures: Design for Testability System-on-Chip Test Architectures: Nanometer Design for Testability Рейтинг: 0 из 5 звезд0 оценок